Texas Instruments

Description

AT- 27C010 CMOS EPROM RELIABILITY DATA. -125 C OPERATING LIFE TEST. -200 C RETENTION BAKE. -PROGRAM AND ERASE. -HIGH TEMPERATURE IC MEM EPROM 27C010 200NS. Additional Information. -. IC MEM EPROM 27C010 200NS. 0.00. United States (US). 85352100. 0 kg. IC MEM EPROM 27C010 Page 1. Features. Fast read access time 45ns. Low-power CMOS operation. 100 A max standby. 25mA max active at 5MHz. JEDEC standard 27C010 . U9. Rapid keystrokes on all area of the keyboard may cause a shift key lock and/or keyboard lockup. In some rare cases, improper keyboard. 1.11.1.12. SYSTEM. SETUP. 27C010 . 27C512. U1. U113. INITIAL RELEASE. 1.13.1.14. 1.13.1.14. 201311201. 201311301. SYSTEM. SETUP. 27C010 . 27C512.