Description
Page 1. Calculation of Semiconductor Failure Rates. William J. Vigrass. One of the fundamentals of understanding a products reliability requires an understanding of the calculation of the failure rate. The traditional method of determining CD74HC4066M96. S. SOIC. 14. 74HC4066N. NXP Semiconductor. CD74HC4066E. S. PDIP. 14. 74HC4066PW . NXP Semiconductor. CD74HC4066PW. S. TSSOP. 14. 74HC4066PW -T. NXP Semiconductor. CD74HC4066PWR. S. TSSOP. H. 10. 1 toestemming van de auteursrechthebbende. A. * 16 Bit. G. 7. 8. 9. 10. IP16. 2P82. 100n. FP23. 3P85. 100R. 71. 4. 1. 2. 2K2. 3P81. 74HC4066PW . 7P15-1. 13. 10K. 3P80. 100R. 3P84. 9P41. RES. 3P36. 10K. 10. +3V3-STANDBY . 9P19. 3P38 100R. 3P37. 100R. 3P06. 100R. 3P36 100R. 3P34 100R. 3P07. 9P26. 9P19. RES. 12. 71. 4. 11. 10. 7P15-4. 74HC4066PW . 9P24. +3V3. 71. 4. 1. 2. 100n. 2P35. 7P15-1. 74HC4066PW . 13. 5. 100R. 3P85. 1P02. B3B-PH-SM4-TBT (LF).
Part Number | 74HC4066PW |
Brand | Texas Instruments |
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74HC4066PW
TI/ST
33225
1.28
HK YOUCUANG XINRONG INDUSTRIAL LIMITED
74HC4066PW
TexasIns
5000
2.535
Hong Kong Switch Union Electronics Company Limited
74HC4066PW
TI/CC
140
3.79
Zhaoxin Electronic Limited
74HC4066PW
TI?
26582
5.045
HongKong XingYiLong Electronic Technology Co., Limited
74HC4066PW
TI-BB
15000
6.3
YUFO ELECTRONICS LIMITED