Description
IC SCAN-TEST-DEV/TXRX 64-LQFP Series: 74ABTH Logic Type: Scan Test Device With Transceivers And Registers Supply Voltage: 4.5 V ~ 5.5 V Number of Bits: 18 Operating Temperature: -40~C ~ 85~C Mounting Type: Surface Mount Package / Case: 64-LQFP Supplier Device Package: 64-LQFP (10x10)
Part Number | SN74ABTH182646APM |
Main Category | Integrated Circuits (ICs) |
Sub Category | Logic - Specialty Logic |
Brand | Texas Instruments |
Description | IC SCAN-TEST-DEV/TXRX 64-LQFP |
Series | 74ABTH |
Packaging | Tray |
Logic Type | Scan Test Device With Transceivers And Registers |
Supply Voltage | 4.5 V ~ 5.5 V |
Number of Bits | 18 |
Operating Temperature | -40°C ~ 85°C |
Mounting Type | Surface Mount |
Package / Case | 64-LQFP |
Supplier Device Package | 64-LQFP (10x10) |
Image |
SN74ABTH182646APM
TI/ST
5000
1.03
Briew Technology (HK) Limited
SN74ABTH182646APM
TexasIns
23300
1.5775
SHENZHEN RONGXIN MICRO TECH CO.,LTD
SN74ABTH182646APM
TI/CC
8000
2.125
ANJIEXIN (HK) ELECTRONIC TECHNOLOGY LIMITED
SN74ABTH182646APM
TI?
3300
2.6725
Unit Electronics Co., Limited
SN74ABTH182646APM
TI-BB
9000
3.22
Shenzhen Yu Qin Xuan electronics Co., LT