Description
IC SCAN TEST DEVICE BUFF 24-DIP Series: 74BCT Logic Type: Scan Test Device with Inverting Buffers Supply Voltage: 4.5 V ~ 5.5 V Number of Bits: 8 Operating Temperature: 0~C ~ 70~C Mounting Type: Through Hole Package / Case: 24-DIP (0.300, 7.62mm) Supplier Device Package: 24-PDIP
Part Number | SN74BCT8240ANTE4 |
Brand | Texas Instruments |
Image |
SN74BCT8240ANTE4
TI/ST
5000
1.32
Riking Technology (HK) Co., Limited
SN74BCT125ANSR
TexasIns
12000
2.29
Pacific Corporation
SN74BCT245DBR
TI/CC
545
3.26
Jainam Electronics Pvt.Ltd
SN74BCT125N
TI?
3
4.23
Ryston Electronics s.r.o
SN74BCT126N
TI-BB
36
5.2
U.S. MICROTECH, INC