Description
IC SCAN TEST DEVICE BUFF 24-DIP Series: 74BCT Logic Type: Scan Test Device with Buffers Supply Voltage: 4.5 V ~ 5.5 V Number of Bits: 8 Operating Temperature: 0~C ~ 70~C Mounting Type: Through Hole Package / Case: 24-DIP (0.300, 7.62mm) Supplier Device Package: 24-PDIP
Part Number | SN74BCT8244ANTE4 |
Brand | Texas Instruments |
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SN74BCT8244ANTE4
TI/ST
5000
1.6
Riking Technology (HK) Co., Limited
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