![](/g/img/star_on.png)
![](/g/img/star_on.png)
![](/g/img/star_on.png)
![](/g/img/star_on.png)
![](/g/img/star_off.png)
Description
IC SCAN TEST DEVICE LATCH 24-DIP Series: 74BCT Logic Type: Scan Test Device with D-Type Latches Supply Voltage: 4.5 V ~ 5.5 V Number of Bits: 8 Operating Temperature: 0~C ~ 70~C Mounting Type: Through Hole Package / Case: 24-DIP (0.300, 7.62mm) Supplier Device Package: 24-PDIP
Part Number | SN74BCT8373ANT |
Main Category | Integrated Circuits (ICs) |
Sub Category | Logic - Specialty Logic |
Brand | Texas Instruments |
Description | IC SCAN TEST DEVICE LATCH 24-DIP |
Series | 74BCT |
Packaging | Tube |
Logic Type | Scan Test Device with D-Type Latches |
Supply Voltage | 4.5 V ~ 5.5 V |
Number of Bits | 8 |
Operating Temperature | 0°C ~ 70°C |
Mounting Type | Through Hole |
Package / Case | 24-DIP (0.300", 7.62mm) |
Supplier Device Package | 24-PDIP |
Image | ![]() |
SN74BCT8373ANT
TI/ST
9000
0.25
Fairstock HK Limited
SN74BCT8373ANT
TexasIns
3680
1.0675
ONSTAR ELECTRONICS CO., LIMITED
SN74BCT8373ANT
TI/CC
11741
1.885
CIS Ltd (CHECK IC SOLUTION LIMITED)
SN74BCT8373ANT
TI?
3000
2.7025
HONG KONG YUE JIN PENG ELECTRONICS CO.
SN74BCT8373ANT
TI-BB
16800
3.52
SHENZHEN RONGXIN MICRO TECH CO.,LTD