Description
IC SCAN TEST DEVICE W/FF 24-SOIC Series: 74BCT Logic Type: Scan Test Device with D-Type Edge-Triggered Flip-Flops Supply Voltage: 4.5 V ~ 5.5 V Number of Bits: 8 Operating Temperature: 0~C ~ 70~C Mounting Type: Surface Mount Package / Case: 24-SOIC (0.295, 7.50mm Width) Supplier Device Package: 24-SOIC
Part Number | SN74BCT8374ADWR |
Main Category | Integrated Circuits (ICs) |
Sub Category | Logic - Specialty Logic |
Brand | Texas Instruments |
Description | IC SCAN TEST DEVICE W/FF 24-SOIC |
Series | 74BCT |
Packaging | Tape & Reel (TR) |
Logic Type | Scan Test Device with D-Type Edge-Triggered Flip-Flops |
Supply Voltage | 4.5 V ~ 5.5 V |
Number of Bits | 8 |
Operating Temperature | 0°C ~ 70°C |
Mounting Type | Surface Mount |
Package / Case | 24-SOIC (0.295", 7.50mm Width) |
Supplier Device Package | 24-SOIC |
Image |
SN74BCT8374ADWR
TI/ST
5559
0.04
HK HEQING ELECTRONICS LIMITED
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TexasIns
16000
1.155
Finestock Electronics HK Limited
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TI/CC
37500
2.27
Cinty Int'l (HK) Industry Co., Limited
SN74BCT8374ADWR
TI?
10000
3.385
CXS INDUSTRY (HK) CO., LIMITED
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TI-BB
12028
4.5
N&S Electronic Co., Limited