Description
IC SCAN TEST DEVICE W/FF 24-DIP Series: 74BCT Logic Type: Scan Test Device with D-Type Edge-Triggered Flip-Flops Supply Voltage: 4.5 V ~ 5.5 V Number of Bits: 8 Operating Temperature: 0~C ~ 70~C Mounting Type: Through Hole Package / Case: 24-DIP (0.300, 7.62mm) Supplier Device Package: 24-PDIP
Part Number | SN74BCT8374ANT |
Main Category | Integrated Circuits (ICs) |
Sub Category | Logic - Specialty Logic |
Brand | Texas Instruments |
Description | IC SCAN TEST DEVICE W/FF 24-DIP |
Series | 74BCT |
Packaging | Tube |
Logic Type | Scan Test Device with D-Type Edge-Triggered Flip-Flops |
Supply Voltage | 4.5 V ~ 5.5 V |
Number of Bits | 8 |
Operating Temperature | 0°C ~ 70°C |
Mounting Type | Through Hole |
Package / Case | 24-DIP (0.300", 7.62mm) |
Supplier Device Package | 24-PDIP |
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Finestock Electronics HK Limited
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SHENZHEN RONGXIN MICRO TECH CO.,LTD
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